He reemission implanted in metals

Below ∼0.25 Tm, He migration is too slow for bubbles to grow large, but bubble density increases up to a certain fluence, where neighboring bubbles start to coalesce. Accordingly, He release is mostly caused by mechanical failure or blister rapture. With increasing fluence, all defects (bubbles and dislocation loops) tangle or inter connected with neighboring defects and accordingly He migration to the surface along the tangled or connected defects is enhanced, resulting 100% reemission easily without making multilayered blistering.