کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7991543 | 1516142 | 2018 | 27 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Three-dimensional thermal stress analysis of the re-oxidized Ni-YSZ anode functional layer in solid oxide fuel cells
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فلزات و آلیاژها
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چکیده انگلیسی
Nickel-yttria-stabilized zirconia (Ni-YSZ) cermet is widely used as an anode material in solid oxide fuel cells (SOFCs); however, Ni re-oxidation causes critical problems due to volume expansion, which causes high thermal stress. We fabricated a Ni-YSZ anode functional layer (AFL), which is an essential component in high-performance SOFCs, and re-oxidized it to investigate the related three-dimensional (3D) microstructural and thermo-mechanical effects. A 3D model of the re-oxidized AFL was generated using focused ion beam-scanning electron microscope (FIB-SEM) tomography. Re-oxidation of the Ni phase caused significant volumetric expansion, which was confirmed via image analysis and calculation of the volume fraction, connectivity, and two-phase boundary density. Finite element analysis (FEA) with simulated heating to 500-900â¯Â°C confirmed that the thermal stress in re-oxidized Ni-YSZ is concentrated at the boundaries between YSZ and re-oxidized NiO (nickel oxide). NiO is subjected to more stress than YSZ. Stress exceeding the fracture stress of 8â¯mol% YSZ appears primarily at 800â¯Â°C or higher. The stress is also more severe near the electrolyte-anode boundary than in the Ni-YSZ cermet and the YSZ regions. This may be responsible for the electrolyte membrane delamination and fracture that are observed during high-temperature operation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 752, 5 July 2018, Pages 148-154
Journal: Journal of Alloys and Compounds - Volume 752, 5 July 2018, Pages 148-154
نویسندگان
Jun Woo Kim, Kiho Bae, Hyun Joong Kim, Ji-won Son, Namkeun Kim, Stefan Stenfelt, Fritz B. Prinz, Joon Hyung Shim,