Electrical and mechanical characterization of two-phase alloys by means of scanning probe microscopy in dynamic impedance spectroscopy mode

Dynamic impedance spectroscopy, evaluated for measuring non-stationary systems, was used in combination with scanning probe microscope. Using this approach, localized impedance measurements in the AFM contact mode could be carried out. Additionally, impedance-force curves were made at each phase of investigated materials to illustrate the relation between impedance and the force applied to a probe. Therefore, correlation of electrical and mechanical properties with particular phases of investigated two-phase alloys was made possible. The materials used in this study were spheroidal graphite cast iron and 2205 duplex stainless steel, both materials with clearly defined phases having significantly different properties.