The diminishing of crystal structure of Sn9Zn alloy due to electrical current stressing

The variations in the crystal structure of Sn9Zn alloy due to electrical current stressing were investigated with in situ synchrotron XRD analysis. The XRD (X-ray Diffraction) orientation peaks of both Sn and Zn crystals diminished rapidly upon current stressing. The behavior of peak diminishing indicated the electrodisruption of the crystal structure. The electrodisruption was correlated logarithmically to the strain, estimated from the XRD peak shift, as induced by current stressing. The peak diminishing of the Zn crystal was also ascribed to the electrodissolution of Zn in the Sn matrix as revealed by SEM image.