Effect of copper concentration on the characteristics of Cu2ZnSnS4 (CZTS) thin films

In this paper, we have investigated the effect of copper concentration on the structural, morphological and optical properties of Cu2ZnSnS4 thin films. CZTS thin films have been successfully deposited by the Spray Sandwich technique with different copper concentration ranging from 0.01 to 0.04 M. The structural properties using X ray diffraction (XRD) has revealed the formation of polycrystalline CZTS thin films. We noted that the increase of the copper concentration has improved the crystallinity of the CZTS thin films. The optical band gap was estimated to be 1, 1.8 and 1.6 eV respectively for copper concentration 0.02, 0.03 and 0.04 M.