کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8037997 | 1518319 | 2016 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
On the validity of the Äerenkov limit as a criterion for precise band gap measurements by VEELS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The generation of Äerenkov photons, contributions from retardation and surface effects, and the excitation of guided light modes can complicate the analysis of valence electron energy-loss spectroscopy (VEELS) data. In recent works it was argued that working below the so-called Äerenkov limit unwanted spectral contributions can be avoided, simplifying the reliable measurement of band gap energies and the extraction of the dielectric function by the Kramers-Kronig analysis. Here, relativistic simulations of valence electron energy-loss spectra of GaAs are employed in order to identify different spectral contributions. It is found that for electron energies below the Äerenkov limit the spectra can still be affected by the excitation of guided light modes and retardation effects. These spectral contributions can influence the position of the apparent band gap signal and can be problematic for the Kramers-Kronig analysis when working below or above the Äerenkov limit.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 160, January 2016, Pages 80-83
Journal: Ultramicroscopy - Volume 160, January 2016, Pages 80-83
نویسندگان
Rolf Erni,