کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8042164 | 1518702 | 2013 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic characterization of ion-irradiated multi-layer graphenes
ترجمه فارسی عنوان
خصوصیات اسپکتروسکوپی گرافن های چند لایه تابش یون
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
چکیده انگلیسی
Low-energy Ar ions (0.5-2Â keV) were irradiated to multi-layer graphenes and the damage process, the local electronic states, and the degree of alignment of the basal plane, and the oxidation process upon ion irradiation were investigated by Raman spectroscopy, soft X-ray absorption spectroscopy (XAS) and in situ X-ray photoelectron spectroscopy (XPS). By Raman spectroscopy, we observed two stages similar to the case of irradiated graphite, which should relate to the accumulations of vacancies and turbulence of the basal plane, respectively. XAS analysis indicated that the number of sp2-hybridized carbon (sp2-C) atoms decreased after ion irradiation. Angle-resolved XAS revealed that the orientation parameter (OP) decreased with increasing ion energy and fluence, reflecting the turbulence of the basal plane under irradiation. In situ XPS shows the oxidation of the irradiated multi-layer graphenes after air exposure.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 315, 15 November 2013, Pages 64-67
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 315, 15 November 2013, Pages 64-67
نویسندگان
Akira Tsukagoshi, Shin-ichi Honda, Ryo Osugi, Hiraku Okada, Masahito Niibe, Mititaka Terasawa, Ryuji Hirase, Hirokazu Izumi, Hideki Yoshioka, Keisuke Niwase, Eiji Taguchi, Kuei-Yi Lee, Masaki Oura,