کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8151388 | 1524441 | 2014 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Growth of a Si0.50Ge0.50 crystal by the traveling liquidus-zone (TLZ) method in microgravity
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
An alloy semiconductor Si1âxGex (x~0.5) crystal was grown by the TLZ method in microgravity. Ge concentration was 48.5±1.5 at% for the whole region of 10 mm diameter and 17.2 mm long crystal. Compositional uniformity was established but the average concentration was a little deviated from the expected 50 at%. For further improving compositional uniformity and for obtaining Si0.5Ge0.5 crystals in microgravity, growth conditions were refined based on the measured axial compositional profile. In determining new growth conditions, difference in temperature gradient in a melt, difference in freezing interface curvature, and difference in melt back length of a seed between microgravity and terrestrial growth were taken into consideration.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 388, 15 February 2014, Pages 12-16
Journal: Journal of Crystal Growth - Volume 388, 15 February 2014, Pages 12-16
نویسندگان
K. Kinoshita, Y. Arai, Y. Inatomi, T. Tsukada, S. Adachi, H. Miyata, R. Tanaka, J. Yoshikawa, T. Kihara, H. Tomioka, H. Shibayama, Y. Kubota, Y. Warashina, Y. Sasaki, Y. Ishizuka, Y. Harada, S. Wada, C. Harada, S. Yoda,