Static electric field enhanced recrystallization of copper phthalocyanine thin film during annealing

External electric field may be applied on an organic semiconductor layer at different stages of its fabrication to tailor the film structure and morphology as per the need of the device being fabricated. In this paper, we present an easy to implement method of applying static electric field on the thin film of copper phthalocyanine (CuPc) during its post deposition annealing, and discuss its effects on the film properties. Characterization by x-ray diffraction (XRD) spectroscopy and field emission scanning electron microscopy (FESEM) reveals that the applied electric field significantly enhances the recrystallization process of CuPc thin film. Thus larger grains and longer nanorods are formed in the film improving its crystallinity due to electric field. The effects of the ambient pressure and electric field strength have also been reported. The possible reasons for the observed phenomena have been discussed.