کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8209734 1532100 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Secondary ion mass spectrometry signatures for verifying declarations of fissile‐material production
ترجمه فارسی عنوان
امضاهای طیف سنجی جرمی ثانویه برای تأیید اعلامیه های تولید مواد منفجره تولیدی
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم تشعشع
چکیده انگلیسی
Direct analysis of uranium enrichment facility components were performed using secondary ion mass spectrometry (SIMS). A standard protocol was developed to enable preparation of SIMS samples from a corroded pipe piece without disturbing the corrosion layer. Unique uranium, oxygen and fluorine containing signatures were discovered in the corrosion layer by performing a mass scan of the region of interest from 230 to 280 amu. These signatures identified the source of the corrosion layer as uranium hexafluoride (UF6) or an associated hydrolysis product. Isotopic analysis of the corrosion layer determined enrichment of 235U to a value of 0.0116±0.0019 for the 235U/238U isotopic ratio as compared to the NIST traceable standard (CRM 112-A) with a natural 235U/238U isotopic ratio of 0.007254±0.000004. SIMS depth analysis revealed that the corrosion layer was isotopically homogenous to a depth of ~23.5 µm. Optical profilometry measurements prior to and following SIMS depth analysis were used to determine a sputter rate of 0.48 nm/s for 18.5 keV O− ion bombardment of the corrosion layer. The data presented is conclusive evidence that SIMS depth analysis can be used to identify novel nuclear archeology signatures from uranium enrichment components and perform meaningful isotopic analysis of these signatures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Radiation and Isotopes - Volume 97, March 2015, Pages 125-129
نویسندگان
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