کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9567502 | 1503718 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Mechanical distinction and manipulation of atoms based on noncontact atomic force microscopy
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Mechanical distinction and manipulation of atoms based on noncontact atomic force microscopy Mechanical distinction and manipulation of atoms based on noncontact atomic force microscopy](/preview/png/9567502.png)
چکیده انگلیسی
Using noncontact atomic force microscopy (NC-AFM), we have succeeded in imaging two-dimensional (2D) Ge islands as well as Ge atom clusters on Si(1Â 1Â 1)-(7Â ÃÂ 7) surface with atomic resolution. We have investigated the tip-sample distance dependence of NC-AFM images of oxygen adsorbed Si(1Â 1Â 1)-(7Â ÃÂ 7) surface, and achieved the chemical distinction between oxygen and Si atom species. Besides, using a soft nanoindentation based on the NC-AFM method for mechanically manipulating Si adatoms of the Si(1Â 1Â 1)-(7Â ÃÂ 7) surface, we have achieved atom removal, i.e., vertical manipulation, at tip and sample temperature of 78Â K as well as at room temperature (RT). In addition, as an application of this soft nanoindentation method, we have produced the lateral displacement of Si adatoms towards metastable positions in the half unit cell of the Si(1Â 1Â 1)-(7Â ÃÂ 7) reconstruction at 78Â K.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 241, Issues 1â2, 28 February 2005, Pages 2-8
Journal: Applied Surface Science - Volume 241, Issues 1â2, 28 February 2005, Pages 2-8
نویسندگان
Seizo Morita, Insook Yi, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Ãscar Custance, Masayuki Abe,