Microscale chemical and electrostatic surface patterning of Dow Cyclotene by N2 plasma

The depth and friction differences occurring on surface modification, which were revealed through our use of patterning, are apparent, and are, in fact, caused by enhanced electrostatic interaction of the chemically modified surface with the AFM tip, as confirmed by the tapping mode data. Some of the electrostatic surface charge, introduced by the positively charged species chemically modifying the Cyclotene surface, is reduced by subsequent charge neutralization. XPS has shown this to be due to the oxidation of these surface charges on atmospheric exposure, initially ∼70%, to form alcohol, carbonyl and carboxylic acid groups. Contact mode AFM imaging of plasma-patterned surfaces is revealed as an excellent tool for the high-resolution characterization of such surfaces.