کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9774255 1508510 2005 152 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Force measurements with the atomic force microscope: Technique, interpretation and applications
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Force measurements with the atomic force microscope: Technique, interpretation and applications
چکیده انگلیسی
After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1-104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science Reports - Volume 59, Issues 1–6, October 2005, Pages 1-152
نویسندگان
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