کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9809915 | 1517719 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electrochemical stability of magnetron-sputtered Ti films on sintered and sintered/plasma nitrided Fe-1.5% Mo alloy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Electrochemical stability of magnetron-sputtered Ti films on sintered and sintered/plasma nitrided Fe-1.5% Mo alloy Electrochemical stability of magnetron-sputtered Ti films on sintered and sintered/plasma nitrided Fe-1.5% Mo alloy](/preview/png/9809915.png)
چکیده انگلیسی
We report on the electrochemical stability of magnetron-sputtered Ti films on sintered and sintered/plasma nitrided Fe-1.5% Mo alloy. Open-circuit potential and potentiodynamic polarization measurements were carried out in pH 7 saline solutions together with scanning electron microscopy imaging. Magnetron-sputtered Ti films on sintered samples were found to be gradually more electrochemically stable as the Ti deposition time increased from 20 to 60 min, characterized by open-circuit potential and potentiodynamic polarization measurements and SEM micrographs. Sintered/plasma nitrided+Ti samples, however, presented the best electrochemical stability for an intermediate deposition time of 30 min, while films deposited during 60 min were found to be more easily corroded, probably due to a decrease in the film-to-substrate adhesion because of the presence of a nitride layer prior to coating. In the case of sintered/plasma nitrided+Ti samples whose deposition time was 20 or 30 min, the effect of the two layers (nitride and Ti) was clearly greater than the sum of the individual effects, characterizing a synergistic effect.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 191, Issues 2â3, 21 February 2005, Pages 206-211
Journal: Surface and Coatings Technology - Volume 191, Issues 2â3, 21 February 2005, Pages 206-211
نویسندگان
José de Pinho Alves Neto, Cristiano Giacomelli, AloıÌsio Nelmo Klein, Joel Louis René Muzart, Almir Spinelli,