کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9816891 | 1518376 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Focused ion beam-nanomachined probes for improved electric force microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Focused ion beam-nanomachined probes for improved electric force microscopy Focused ion beam-nanomachined probes for improved electric force microscopy](/preview/png/9816891.png)
چکیده انگلیسی
Nanomachining and beam-assisted Pt deposition by a focused ion beam (FIB) was used to modify AFM probes for improved electric force measurements. Si3N4 cantilevers have been endowed with a nano-electrode at the tip apex to confine the electro-sensitive area at the very tip. This action results in both a marked decrease of the parasitic capacitive effect and in an improved electric force microscopy (EFM) contrast and resolution, with respect to usual, full metal-coated cantilevers. This fabrication approach is suited to the development of innovative electro-sensitive probes, useful in different scanning probe techniques.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 104, Issues 3â4, October 2005, Pages 220-225
Journal: Ultramicroscopy - Volume 104, Issues 3â4, October 2005, Pages 220-225
نویسندگان
Claudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, Paolo Facci,