On the energy and time resolution measurements of bismuth germanium silicon oxide (BGSO) crystal grown by Czochralski technique

Bismuth germanium silicon oxide single crystal was grown from Bi4Ge3O12-Bi4Si3O12 solid solution system by the Czochralski technique using resistively heated platinum crucible. Structural, optical transmission, photoluminescence and energy/time resolution studies have been made on the grown crystals. Optical transmission spectrum showed the magnitude of transmission about 63% at the peak emission without any trace of absorption edges. Photoluminescence results revealed the emission has a peak at 481 nm for an excitation wavelength of 298 nm. We inferred that voids and gaseous bubble inclusions present in the crystal and detector testing experimental conditions, in addition, cause deterioration in energy and time resolutions.