Optimization of bent perfect Si(2Â 2Â 0)-crystal monochromator for residual strain/stress instrument-Part II

Optimized diffractometer arrangements for residual strain measurements employing curved crystal monochromators provide good luminosity and a high Δd/d resolution in the vicinity of usually used scattering angle 2θS≈±90°. Due to a variety of designs of the diffractometers which could be installed at a constant or different take-off angles, except a few attempts, there is a lack of experimental evidence providing a help in a choice of parameters for an optimum performance. In addition to our earlier investigations with curved Si(3 1 1) monochromator employed in different diffraction geometries (see paper I [M.K. Moon et al., Physica B, submitted [1]]), the present paper presents the monochromator properties of cylindrically bent perfect Si(2 2 0) crystals as another candidate to be used as monochromator in residual strain diffractometers.