کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9837636 | 1525281 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Photoluminescence thermal quenching behaviors of Er-doped SiOx (x<2) prepared by ion implantation
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Photoluminescence thermal quenching behaviors of Er-doped SiOx (x<2) prepared by ion implantation Photoluminescence thermal quenching behaviors of Er-doped SiOx (x<2) prepared by ion implantation](/preview/png/9837636.png)
چکیده انگلیسی
Erbium and silicon were implanted into thermally grown SiO2 film on Si (1 1 0) substrates, followed by thermal treatment at 700-1200 °C for 30 min. The microstructure was studied by using transmission electron microscope (TEM) and X-ray diffraction meter (XRD). Silicon nanocrystals (nc-Si), which enwrapped by amorphous silicon (a-Si), were observed when the implanted films annealed at T>900 °C. The thermal quenching behavior at λ=1.535μm and its relation with anneal temperature were also investigated. With anneal temperature increasing, both the portion of a-Si and the intensity quenching decreased. Efficient luminescence from Er ions and weak intensity thermal quenching were obtained from the sample annealed at 1100 °C. The role of excessive a-Si in non-radiative processes at T>150 K was discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica B: Condensed Matter - Volume 362, Issues 1â4, 15 May 2005, Pages 208-213
Journal: Physica B: Condensed Matter - Volume 362, Issues 1â4, 15 May 2005, Pages 208-213
نویسندگان
C.S. Zhang, H.B Xiao, Y.J. Wang, Z.J. Cheng, X.L. Cheng, F. Zhang,