Deposition of (Y2BaCuO5/YBa2Cu3O7−x) × N multilayer films on Ni-based textured substrates

Deposition of (Y2BaCuO5-0.5 nm/YBa2Cu3O7−x∼15 nm) × N multilayer films on rolling-assisted biaxially textured Ni-alloy (RABiTSTM) substrates was investigated, as a new candidate coated conductor architecture for improved flux pinning. Significant enhancements of critical current density (Jc) > 6-fold were measured for applied magnetic fields up to 7 T at 77 K, for multilayer films compared to YBa2Cu3O7−x-only films. By comparing Jc(H)/Jc(0 T) plots of films deposited on RABiTS and single-crystal substrates, the relative increase of Jc(H) from pinning was the same as measured on both substrates. This indicates the varying microstructural properties of the RABiTS templates were, on average, not adversely affecting the pinning enhancements.