کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9841953 | 1525810 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of defect modes in YBa2Cu3O7âδ thin films probed by Raman scattering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
A Raman analysis is performed on a series of fully oxygenated YBa2Cu3O7âδ thin films, on MgO(1 0 0) substrates, deposited by the pulsed laser technique at temperatures between 680 °C and 820 °C. θ â 2θ scans of the films by the X-ray diffraction show that the YBCO films are oriented in the c-axis. There are no extra peaks appearing in the X-ray diffraction data. Besides the well-known active modes, however, Raman spectra reveal a number of defect modes. The defect mode at 594 cmâ1 redshifts and merges toward the O(4)-Ag mode at 502 cmâ1 with decreasing deposition temperatures. This mode is significantly asymmetrical and broad, whereas the mode at 243 cmâ1 is symmetrical, with a small full width at half maximum remaining unchanged at a value around its own frequency. The intensity of the mode at 243 cmâ1 seems to depend on the intensity of the mode at 594 cmâ1. Quantitative calculations concerning the relative intensities show that the two modes are related to each other.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity - Volume 418, Issues 1â2, 15 January 2005, Pages 28-34
Journal: Physica C: Superconductivity - Volume 418, Issues 1â2, 15 January 2005, Pages 28-34
نویسندگان
Seongsik Hong, Hyunchul Jo, Hyeonsik Cheong, Gwangseo Park,