کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9845817 | 1526521 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Radiation tests of CMS RPC muon trigger electronic components
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 538, Issues 1â3, 11 February 2005, Pages 708-717
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 538, Issues 1â3, 11 February 2005, Pages 708-717
نویسندگان
Karol BuÅkowski, Ivan Kassamakov, Jan Królikowski, Krzysztof Kierzkowski, Maciej KudÅa, Teppo Maenpaa, Krzysztof Poźniak, Dominik Rybka, Eija Tuominen, Donatella Ungaro, Grzegorz Wrochna, Wojciech ZaboÅotny,