Keywords: نقص رابط; Brazing; Image analysis; Steels; Nickel alloys; Interface defects;
مقالات ISI نقص رابط (ترجمه نشده)
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Keywords: نقص رابط; ï¼Aluminum alloy; Friction stir lap welding; Interface defects; Mechanical properties; Formation mechanism;
A candidate fusion engineering material, WC-FeCr
Keywords: نقص رابط; Cermets; Interface defects; Irradiation; Helium bubbles; Transmission electron microscopy;
Effect of interface defect density on performance of perovskite solar cell: Correlation of simulation and experiment
Keywords: نقص رابط; Device fabrication; SCAPS; Interface defects;
Investigation on interface-related defects by photoluminescence of cubic (Al)GaN/AlN multi-quantum wells structures
Keywords: نقص رابط; C-GaN; (Al)GaN/AlN; Interface defects; Localization states;
C-DLTS interface defects in Al0.22Ga0.78N/GaN HEMTs on SiC: Spatial location of E2 traps
Keywords: نقص رابط; Hysteresis effect; AlGaN/GaN HEMT; Interface defects; DLTS;
Microstructure characterization of multifunctional As4S4/Fe3O4 nanocomposites prepared by high-energy mechanical milling
Keywords: نقص رابط; Microstructure; Mechanical milling; Electron microscopy; Positron annihilation; X-ray diffraction; Nanocomposite; Interface defects;
Helium bubble evolution in ion irradiated Al/B4C metal metrix composite
Keywords: نقص رابط; Interface defects; Ceramics; Metal matrix composites; Transmission electron microscopy; Helium bubble
Blue/green electroluminescence from a ZnO nanorods/p-GaN heterojunction light emitting diode under different reverse bias
Keywords: نقص رابط; ZnO; Light emitting diode; Electroluminescence; Interface defects;
Degradation of 4H-SiC IGBT threshold characteristics due to SiC/SiO2 interface defects
Keywords: نقص رابط; SiC IGBT; Interface defects; Threshold voltage; Shallow trap; Deep trap
Comparative analysis of thermally induced degradation of condensation-grown (1Â 0Â 0)Ge0.75Si0.25/SiO2 interfaces by electron spin resonance
Keywords: نقص رابط; Silicon-germanium-on-insulator (SGOI); Silicon germanium alloys; Electron spin resonance (ESR); Interface defects; Pb type centers; GePb1 defect; High mobility transistors; Thermal degradation;
Electrical and Chemical Studies on Al2O3 Passivation Activation Process
Keywords: نقص رابط; Surface passivation; p-type silicon; interface defects; effective charges; Al2O3;
Chemical trends and passivation of defects at Al2O3:GaAs/InAs/InP/GaSb interfaces
Keywords: نقص رابط; III-V semiconductor; MOSFET; Interface defects; Calculation; Passivation;
Tailoring radiation damage in ZnO by surface modification
Keywords: نقص رابط; 61.72.Cc; 61.72.Dd; 68.55.Ln; 61.72.Ff; Implantation; Semiconductor; Interface defects;
Ordered coalescence of nanocrystallites contributing to the rapid anisotropic grain growth in silicon nitride ceramics
Keywords: نقص رابط; Abnormal grain growth; Phase transformations; Interface defects; Spark plasma sintering; HREM
Perturbation-based stochastic finite element analysis of the interface defects in composites via Response Function Method
Keywords: نقص رابط; Composite materials; Interface defects; Stochastic finite element method; Response Function Method; Stochastic perturbation technique
Effect of the surface on ion-beam damage build-up in ZnO
Keywords: نقص رابط; Implantation; Semiconductor; Interface defects; Intermediate defect peak
Stability and high-frequency operation of amorphous In–Ga–Zn–O thin-film transistors with various passivation layers
Keywords: نقص رابط; a-In–Ga–Zn–O; Thin film transistor; Passivation; Constant current stress; Negative bias light illumination; Bulk defects; Interface defects
Effect of interface defects on shear strength and fluid channeling at cement–interlayer interface
Keywords: نقص رابط; Hydraulic fracturing; Cement–interlayer interface; Interface defects; Fluid channeling; Mathematical model
Energy band alignment at interfaces of semiconducting oxides: A review of experimental determination using photoelectron spectroscopy and comparison with theoretical predictions by the electron affinity rule, charge neutrality levels, and the common anion
Keywords: نقص رابط; Semiconducting oxides; Energy band alignment; Photoemission; Electron affinity rule; Fermi level pinning; Interface defects; Induced gap states; Common anion rule
A corrosion couple experiment reproducing the black pad phenomenon found after the electroless nickel immersion gold process
Keywords: نقص رابط; Corrosion; Galvanization; Interface defects; Black pad
Effect of space charge on the polarization hysteresis characteristics of monolithic and compositionally graded ferroelectrics
Keywords: نقص رابط; Dielectrics; Multilayers; Perovskites; Ferroelectricity; Interface defects
Effect of Y-junction nanotubes on strengthening of nanocomposites
Keywords: نقص رابط; Nanocomposite; Nanotubes; Dislocations; Interface defects; Plastic deformation;
Surface photovoltage investigation of recombination at the a-Si/c-Si heterojunction
Keywords: نقص رابط; Surface photovoltage; Band bending; Interface defects; Amorphous/crystalline heterojunction
Surface Cu depletion of Cu(In,Ga)Se2 films: An investigation by hard X-ray photoelectron spectroscopy
Keywords: نقص رابط; Chalcopyrite thin films; Cu depletion; Interface defects; Hard X-ray photoelectron spectroscopy; Surface energy
The mechanism of initial de-wetting and detachment of thin Au films on YSZ
Keywords: نقص رابط; De-wetting; Voids; Interface defects; Capillary phenomena; Thin films
Anomalous triple junction surface pits in nanocrystalline zirconia thin films and their relationship to triple junction energy
Keywords: نقص رابط; Transmission electron microscopy (TEM); Crystalline oxides; Thin films; Surface structure; Interface defects
Noninvasive three-dimensional visualization of defects and crack propagation in layered foam structures by phase-contrast microimaging
Keywords: نقص رابط; Layered structures; Interface defects; Foams; Stress-rupture; Imaging
Microstructure of the LiCoO2 (cathode)/La2/3−xLi3xTiO3 (electrolyte) interface and its influences on the electrochemical properties
Keywords: نقص رابط; Crystalline oxides; Interface structure; Interface defects; Transmission electron microscopy (TEM); Electrochemistry
Inherent point defects in thermal biaxially tensile strained-(1Â 0Â 0)Si/SiO2 probed by electron spin resonance
Keywords: نقص رابط; Strained silicon; Interface defects; Electron paramagnetic resonance; Thermal oxidation; Paramagnetic point defects;
Interface defect generation probed by low voltage stress induced leakage current
Keywords: نقص رابط; Ultra-thin oxides; Interface defects; Stress induced leakage current;
2-D simulation and analysis of temperature effects on electrical parameters degradation of power RF LDMOS device
Keywords: نقص رابط; Simulation; Temperature effects; LDMOS; Interface defects
Nanocrystal and interface defects related photoluminescence in silicon-rich Al2O3 films
Keywords: نقص رابط; 68.35.Dv; 78.55.âm; 81.15.Cd; Photoluminescence; Nanocrystal; Interface defects;
On the fcc â monoclinic martensite transformation in a Pu-1.7 at.% Ga alloy
Keywords: نقص رابط; Plutonium; Crystal structure; Martensitic phase transformations; Interface defects; Dislocation boundaries;
Structural defects in SiO2/SiC interface probed by a slow positron beam
Keywords: نقص رابط; 68.35.C; 78.70.B; SiO2/SiC interface; Interface defects; Positron annihilation spectroscopy; Dry oxidation; Pyrogenic oxidation;
Multiscale homogenization of n-component composites with semi-elliptical random interface defects
Keywords: نقص رابط; Homogenization method; Interface defects; Random composites; Monte-Carlo simulation; Stochastic perturbation method;