Keywords: نانومواد; Atomic force microscope; Scanning head; Nanometrology; Surface topography;
مقالات ISI نانومواد (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: نانومواد; Nanometrology; Nanoindentation, AFM; Bio; Microscopy; Nanoscopy;
Keywords: نانومواد; Atomic force microscopy; MEMS; Nanomanufacturing; Nanometrology; In-line inspection; Nanopositioning;
Keywords: نانومواد; STM; AFM; SPM; Scanner; Calibration; Drift; Creep; Nonlinearity; Nonorthogonality; Crosstalk coupling; Graphite; HOPG; Recognition; Feature-oriented scanning; FOS; Counter-scanning; Counter-scanned images; Nanometrology; Surface characterization; Nanotech
Keywords: نانومواد; Nanometrology; Optical microscopy; Super-resolution; Microsphere
Keywords: نانومواد; STM; AFM; SPM; Scanner; Calibration; Drift; Creep; Nonlinearity; Nonorthogonality; Crosstalk coupling; Graphite; HOPG; Recognition; Feature-oriented scanning; FOS; Counter-scanning; Counter-scanned images; Nanometrology; Surface characterization; Nanotech
Keywords: نانومواد; Mueller matrix ellipsometry; Mueller matrix polarimetry; Depolarization; Optical scatterometry; Computational metrology; Optical metrology; Nanometrology; Nanostructure
Keywords: نانومواد; Porphyrin; Single-walled carbon nanotubes; Photovoltaics; Nanomedicines; Nanometrology; Spintronics
Keywords: نانومواد; Semiconductors quantum dots; Nanometrology; Mass spectrometry;
Keywords: نانومواد; Nanometrology; Yttrium nanoparticles; Particle number concentration; Daphnia magna; Biological exposure
Nondestructive analysis of lithographic patterns with natural line edge roughness from Mueller matrix ellipsometric data
Keywords: نانومواد; Line edge roughness; Effective medium approximation; Mueller matrix ellipsometry; Optical scatterometry; Nanometrology;
An assessment of errors in sample preparation and data processing for nanoparticle size analyses by AFM
Keywords: نانومواد; Nanometrology; Polystyrene; Atomic force microscopy;
High accuracy flatness metrology within the European Metrology Research Program
Keywords: نانومواد; Flatness metrology; Interferometry; Deflectometry; Capacitive distance sensors; Nanometrology; European Metrology Research Program
In-situ metrology and testing of nanotwinned copper pillars for potential air gap applications
Keywords: نانومواد; Nanotwinned copper pillars; Air gap; In-situ deformation; Nanometrology; Dislocations
Concept, design and capability analysis of the new Deflectometric Flatness Reference at PTB
Keywords: نانومواد; Deflectometry; Flatness measurement; Nanometrology; Simulation; ESAD
Nanomeasuring and nanopositioning engineering
Keywords: نانومواد; Nanometrology; NPM-Machines; Plan mirror interferometers; Nanoprobes
Design and characterization of MIKES metrological atomic force microscope
Keywords: نانومواد; Nanometrology; Metrological atomic force microscope; Laser interferometer; Nonlinearity; Calibration; Uncertainty
A new wavelet filtering for analysis of fractal engineering surfaces
Keywords: نانومواد; Engineering surfaces; Nanometrology; Wavelet filter; Fractal geometry
Compensation of the anisotropic behavior of single crystalline silicon in a 3D tactile sensor
Keywords: نانومواد; Silicon; Anisotropic; Tactile sensor; Nanometrology
A comparative approach for calibration of the depth measuring system in a nanoindentation instrument
Keywords: نانومواد; Laser interferometer; Displacement measurement; Nanoindentation instrument; Nanometrology; Calibration
Reliability of parameters of associated base straight line in step height samples: Uncertainty evaluation in step height measurements using nanometrological AFM
Keywords: نانومواد; Reliability of parameters; Step height; Thickness; Homodyne laser interferometer; AFM; Calibration; Traceability; Nanometrology; Measurement strategy