Micro Raman analysis of MOCVD grown gallium nitride epilayers irradiated with light and heavy ions
Keywords: طیف رامان; 61.80.âx; 07.85.Nc; 78.30.Fs; 61.33.20.Fb; 72.ây; Irradiation effects; XRD; III-V semiconductors; Raman spectrum; Defects;