کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10235005 44963 2014 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Priming and testing silicon patch-clamp neurochips
ترجمه فارسی عنوان
چسباندن و آزمایش نوریچپس های سیلیکون پچ-گیره
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی بیو مهندسی (مهندسی زیستی)
چکیده انگلیسی
We report on the systematic and automated priming and testing of silicon planar patch-clamp chips after their assembly in Plexiglas packages and sterilization in an air plasma reactor. We find that almost 90% of the chips are successfully primed by our automated setup, and have a shunt capacitance of between 10 pF and 30 pF. Blocked chips are mostly due to glue invasion in the well, and variability in the manual assembly process is responsible for the distribution in shunt capacitance value. Priming and testing time with our automated setup is less than 5 min per chip, which is compatible with the production of large series for use in electrophysiology experiments.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: New Biotechnology - Volume 31, Issue 5, 25 September 2014, Pages 430-435
نویسندگان
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