کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10364059 | 871361 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Application of the Taguchi's design of experiments to optimize a bromine chemistry-based etching recipe for deep silicon trenches
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In this article, the design of experiments (DOE) of the Taguchi method was used to optimize a deep silicon trench etching recipe in a commercial etcher, Lam Research TCP9400. A L9 orthogonal array was selected with four factors and three levels. The four factors included chamber pressure, bottom power, flow rate ratio of HBr to He, and flow rate of He-O2. It was found that the chamber pressure has a stronger influence on the etching rate and taper angle of a trench and that the bottom power has a proportional effect on the taper angle of a trench.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 77, Issue 2, February 2005, Pages 110-115
Journal: Microelectronic Engineering - Volume 77, Issue 2, February 2005, Pages 110-115
نویسندگان
Ping Hsun Chen, Colin Yau, Kuang Yung Wu, Steeve Lin, Han Chang Shih,