کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10364776 871819 2005 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Studies of Ti- and Ni-germanide Schottky contacts on n-Ge(1 0 0) substrates
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Studies of Ti- and Ni-germanide Schottky contacts on n-Ge(1 0 0) substrates
چکیده انگلیسی
In this study, we investigated fabrication and characteristics of germanides Schottky contacts on germanium. Ti- and Ni-germanides were fabricated on n-Ge(1 0 0) substrates by sputtering metal Ti or Ni on Ge followed by a furnace annealing. The influence of annealing temperature on the electrical properties of Ti- and Ni-germanide on n-Ge(1 0 0) substrates was investigated. The low temperature ∼300 °C annealing helped to obtain the optimized Schottky contact characteristics in both Ti-germanide/Ge and Ni-germanide/Ge substrates contacts. The well-behaved Ti-germanides/n-Ge Schottky contact with 0.34 eV barrier height was obtained by using a 300 °C annealing process.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 82, Issue 2, October 2005, Pages 93-98
نویسندگان
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