کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10559039 | 969209 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
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چکیده انگلیسی
A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 60, Issue 4, 30 April 2005, Pages 471-478
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 60, Issue 4, 30 April 2005, Pages 471-478
نویسندگان
Z.W. Chen, N. Mail, F.Z. Wei, C.A. MacDonald, W.M. Gibson,