Synthesis and characterization of surface-initiated polymer brush prepared by reverse atom transfer radical polymerization

Surface-initiated reverse atom transfer radical polymerization (reverse ATRP) technique was used to synthesize well-controlled nanostructure of polymer brushes from silicon wafer. Kinetic studies revealed a linear increase in polymer film thickness with reaction time, indicating that chain growth from surface was a controlled process with a “living” characteristic. This technique provides a simple and efficient approach to create various nanostructures of polymer brushes potentially used for designing nanodevices. Analysis of the polymer brush layers was conducted using ellipsometry, XPS, AFM and contact angle measurements, respectively.