Long term creep of TiAl + W + Si with polycrystalline and columnar grain structures

The long term creep properties at 207 MPa and 760 °C of TiAl + W + Si with a fully lamellar microstructure and either polycrystalline grains or a columnar grain structure are compared. The results indicate that the columnar grain structure reduces the primary creep strain and delays the onset of tertiary creep, with only 1.2% creep strain after 10,000 h.