Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

► We present a new AFM based approach to measure the local dielectric response. ► It is based on the measurement of the second harmonic of the photosensor signal. ► This approach allows reaching unprecedented broad frequency range (2-3×104 Hz). ► The method was tested on different poly(vinyl acetate) (PVAc) films.