Dual-wavelength laser polarimeter and its performance capabilities

A dual-wavelength optical polarimetric approach has been proposed as a means of elimination of the systematic errors and estimation of the optical anisotropy parameters for a single DKDP crystal. Our HAUP-related polarimeter uses two semiconductor lasers with the neighbouring wavelengths of 635 nm and 650 nm. Based on the temperature dependence analysis of small characteristic azimuths of light polarization with respect to the axis of the sample, we found the parameters of imperfections of polarization system. We acquired eigen waves ellipticities in a DKDP crystal and found perpendicular to the optic axis value of the optical rotatory power. Our results correlate positively with previously measured data for KDP crystals.