Rapid evaluation of different perovskite absorber layers through the application of depth profile analysis using glow discharge - Time of flight mass spectrometry

Analytical potential of state-of-the art radiofrequency pulsed glow discharge - time of flight mass spectrometry (rf-PGD-ToFMS) is investigated for depth profiling analysis of perovskite films using different precursors (PbI2, PbCl2 or PbBr2)177