کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1195934 964429 2007 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Suppression and Enhancement of Secondary Ion Formation Due to the Chemical Environment in Static-Secondary Ion Mass Spectrometry
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Suppression and Enhancement of Secondary Ion Formation Due to the Chemical Environment in Static-Secondary Ion Mass Spectrometry
چکیده انگلیسی

Through analyzing mixtures of compounds of known gas-phase basicities, the importance of this property on the secondary ions emitted from a surface under primary ion bombardment is investigated. The aim is to obtain a greater understanding of the ionization mechanisms that occur in secondary ion mass spectrometry (SIMS). The commonly used matrix assisted laser desorption/ionization (MALDI) matrix 2,4,6-trihydroxyacetophenone (THAP) and a range of low molecular weight biomolecules were used to investigate whether analyte/matrix suppression effects that have been observed in analogous MALDI experiments were also present in static-SIMS. The outcome of the experiments demonstrates that strong suppression of the quasi-molecular signal of one molecule in a mixture can occur due to the presence of the other, with the gas-phase basicity of the compounds being a good indicator of the secondary ions detected. It is also demonstrated that the suppression of the quasi-molecular ion signal of a compound in a two-component mixture can be minimized by the inclusion of a third compound of suitable gas-phase basicity.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of the American Society for Mass Spectrometry - Volume 18, Issue 8, August 2007, Pages 1559–1567
نویسندگان
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