کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1196201 964465 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry
چکیده انگلیسی

13C labeling is introduced as an alternative to deuterium labeling for analysis of organic materials using secondary ion mass spectrometry (SIMS). A model macromolecular system composed of polystyrene (PS) and poly(methyl methacrylate) (PMMA) was used to compare the effects of isotopic labeling using both deuterium substitution (dPS) and 13C labeling (13C-PS). Clear evidence is shown that deuterium labeling does introduce changes in the thermodynamic properties of the system, with the observation of segregation of dPS to an hPS:dPS/hPMMA interface. This type of behavior could significantly impact many types of investigations due to the potential for improper interpretation of experimental results as a consequence of labeling-induced artifacts. 13C labeling is shown to provide a true tracer for analysis using SIMS.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of the American Society for Mass Spectrometry - Volume 17, Issue 8, August 2006, Pages 1142–1145
نویسندگان
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