Improvement of total reflection X-ray fluorescence spectrometer sensitivity by flowing nitrogen gas

► Intensity of Ar Kα line was decreased by a factor of 17 times by flowing N2 gas. ► S/N of characteristic X-rays with energies less than 8 keV were improved. ► Detection limit of cadmium calculated from Cd Lα line was improved from 7.0 to 2.2 ng by flowing N2 gas. ► This technique can be applied to trace element analysis of Cd in leaching solutions.