کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1240847 | 1495737 | 2006 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: On-site analysis of heavy metal contaminated areas by means of total reflection X-ray fluorescence analysis (TXRF) On-site analysis of heavy metal contaminated areas by means of total reflection X-ray fluorescence analysis (TXRF)](/preview/png/1240847.png)
In this paper the possibilities and restriction for applying the low power TXRF spectrometer PicoTAX for the one-site analysis of heavy metal contaminated soils and sediments are evaluated. Basis for this evaluation is the Superfund Innovative Technology Evaluation (SITE) program, conducted by the U.S. Environmental Protection Protection Agency (US EPA). During a measurement campaign, performed under realistic conditions, 320 soil and sediment samples were analyzed. The task was the fast analysis of the main target elements antimony, arsenic, cadmium, chromium, copper, iron, lead, mercury, nickel, selenium, silver, vanadium, and zinc. These elements were present in wide ranging concentrations.Out of a set of seven primary and five secondary objectives the method detection limits, accuracy and precision of the TXRF measurements are discussed.In addition to the on-site measurements, the application of TXRF analysis for the analysis of soil- and sediment samples after complete microwave assisted acid digestion is reported.Recent instrument improvements have distinctly increased the quality of measurement results. A detailed description of these new developments and new measurement results are discussed
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 61, Issues 10–11, November 2006, Pages 1141–1145