کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1240871 969147 2009 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Recent trends of projection X-ray microscopy in Japan
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Recent trends of projection X-ray microscopy in Japan
چکیده انگلیسی

Recent activities of projection X-ray microscopy in Japan are reviewed. 1) By employing high brightness Schottky electron gun, resolution of 0.1 µm is realized by Tohken CO. group and some application examples are shown. 2) Deblurring of Fresnel diffracted image formed by synchrotron orbital radiation (SOR) X-rays is successfully tried by Chiba University group. Remarkable Fresnel fringes appearing at HeLa cell are mostly reconstructed by an iteration method. 3) Element analysis is carried out by Meiji University group utilizing absorption-edge characteristics between two kinds of X-ray targets without X-ray spectrometer. Actually, Cu and Ni targets are used with an inter-changeable system for elemental analysis of Fe2O3 particles and iron component in a mosquito larva.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 64, Issue 8, August 2009, Pages 729–735
نویسندگان
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