کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1240909 | 1495734 | 2010 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples](/preview/png/1240909.png)
چکیده انگلیسی
A deposition system capable of delivering picoliter quantities of solution in programmable arrays was investigated as a method for sample preparation for total reflection X-ray fluorescence (TXRF) spectroscopy. Arrays of trace metals in solution were deposited on Si wafers. The array deposits provide a capability of depositing closely spaced (100 μm or less), typically 5-20 μm diameter droplets in an area that can be matched to the analysis spot of the TXRF detector. The dried depositions were physically characterized and the effect of deposition type and matrix on the TXRF signal was investigated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 65, Issues 9â10, SeptemberâOctober 2010, Pages 805-811
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 65, Issues 9â10, SeptemberâOctober 2010, Pages 805-811
نویسندگان
Chris M. Sparks, Ursula E.A. Fittschen, George J. Havrilla,