Time-resolved polymer deformation using polarized planar array infrared spectroscopy

Polarized planar array infrared (PA-IR) spectroscopy is shown for the first time to be a powerful approach to study the mechanical deformation of polymers. A dual-beam PA-IR spectrometer was built to enable the simultaneous recording of parallel- and perpendicular-polarized spectra at the same sample spot. The technique provides orientation and structural information during and after fast irreversible deformations with a low-ms (or sub-ms) time resolution and a low data scatter. In proof-of-concept experiments, the possibilities of polarized PA-IR spectroscopy are illustrated by studying the deformation of poly(ethylene terephthalate) thin films.