G′ band Raman lineshape analysis in graphitic foams

In this work we extend the study of the use of Raman spectroscopy to characterize graphitic foams by analyzing the dependence of the G′ band lineshape on both the excitation laser energy and on the topology of the studied area. The G′ band lineshape was found to be strongly correlated with the presence of stacking faults. The contribution of the TO+LATO+LA combination mode at ∼∼2450 cm−1 to the evaluated skewness includes an excitation energy dependence which needs to be considered. We analyze how to take this effect into consideration, thus obtaining a good evaluation of the dependence of the skewness of the G′ band on the presence of stacking faults. We also discuss the correlation between the presence of stacking faults and of in plane defects in graphitic foams.