کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1562448 | 999587 | 2010 | 7 صفحه PDF | دانلود رایگان |
The aim of this paper was to address the effect of the residual stresses within the brittle film on the substrate on the film strength, fracture energy, and interfacial shear strength (IFSS). Special analyses were performed on the SiOx film/polyethulene terephthalate substrate systems. The residual stresses were evaluated by using the curvature method. The film strength, fracture energy, and IFSS were estimated on the basis of the multiple cracking analyses. In the multiple cracking analyses, the system was subjected to the combination of the residual stresses and the unidirectionally applied stress. Results showed that the relationship between the crack density in the film and the applied strain can be predicted by adopting the energy criterion on the basis of the knowledge on the residual stress distributions in the film segment. The film strength and fracture energy for the initiation of film cracking were almost proportional to the compressive residual stresses in the film. With increasing the compressive residual stresses within the film, the IFSS also increased.
Journal: Computational Materials Science - Volume 50, Issue 1, November 2010, Pages 246–252