کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1589732 | 1002006 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Analysis of amorphous-nano-crystalline multilayer structures by optical, photo-deflection and photo-current spectroscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Analysis of amorphous-nano-crystalline multilayer structures by optical, photo-deflection and photo-current spectroscopy Analysis of amorphous-nano-crystalline multilayer structures by optical, photo-deflection and photo-current spectroscopy](/preview/png/1589732.png)
چکیده انگلیسی
Thin film structures consisting of nano-crystalline and amorphous silicon layers deposited on glass by plasma enhanced chemical vapour deposition have been studied by optical spectroscopy methods (transmittance, photo-thermal deflection spectroscopy and photo-current spectroscopy) while structure was examined by Raman spectroscopy. The nano-crystalline layers were grown on the same amorphous layers, using different radio-frequency (RF) discharge powers, leading to different structural and optical properties. The energy dependence of the absorption coefficient above the band gap agrees well to the bimodal size distribution of crystals and crystal fraction estimated by Raman spectroscopy. For energies below the band gap, the comparison of the absorption of the bi-layer systems with respect to single amorphous layer reveals that the samples produced at higher RF discharge present a higher disorder degree (Urbach edge increases) and higher number of structural defects (absorption related to the defects increases).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 40, Issue 1, January 2009, Pages 56-60
Journal: Micron - Volume 40, Issue 1, January 2009, Pages 56-60
نویسندگان
D. Gracin, J. Sancho-Paramon, K. JuraiÄ, A. GajoviÄ, M. Äeh,