Correlation between microstructural and optical properties of silicon thin films grown onto porous alumina by plasma-enhanced CVD method

Correlation between microstructural and optical properties of silicon thin films grown onto porous alumina by plasma-enhanced CVD method

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 658, 15 February 2016, Pages 337-347

F. Laatar, M. Hassen, N.K. Maaloul, K. Khirouni, H. Ezzaouia,