Optical characterization of ferroelectric glycinium phosphite single crystals

Single crystals of glycinium phosphite (GPI) were grown by isothermal evaporation and conventional temperature-lowering techniques. Single crystal and powder X-ray diffraction analysis confirm the monoclinic structure of the as grown crystals. The structural perfection of the as grown crystal was determined through HRXRD analysis. FTIR and Raman analysis revealed the functional groups present in the grown crystals. The optical absorption of the grown crystal was analyzed and the refractive index values for different wavelengths were measured by prism coupling technique. Thermal stability, melting temperature and phase transition temperature of the as grown crystals were identified from TGA/DSC analysis. The dielectric impedance analysis indicates the continuous phase transition nature of the grown crystals. The mechanical strength and hardening co-efficient were determined from Vicker's microhardness measurements for different loads with constant dwell time. The growth mechanism and the defects were analyzed through chemical etching analysis from various crystallographic planes and etching periods.