In-situ XRD study on the peritectic reaction of YBCO thin film on MgO substrate

In order to study the superheating phenomenon during the melting process of YBa2Cu3O7-δ(YBCO) thin films, in-situ XRD measurements were explored around the peritectic temperature (Tp) of YBCO with a high temperature sample stage. As the temperature heating up from 960 to 1080 °C, several phase transformations take place in the YBCO thin-film on an MgO substrate. XRD analysis shows that Ba2Cu3O5.9 phase was formed at the temperature 1050 °C, while YBCO remained in the film even at this temperature evidently higher than its Tp (1010 °C). In addition, Ba2Cu3O5.9 has a certain oriented relationship with its parent phase YBCO.