Morphotropic phase boundary (MPB) effect in Pb (Zr,Ti)O3 rhombohedral/tetragonal multilayered films

Alternating rhombohedral/tetragonal Pb(ZrxTi1−x)O3 (Px) multilayered films were prepared via a chemical solution method. It has been found that the P45/P55 multilayers show significant dielectric enhancement comparing with the uniform P45 and P55 films, and this dielectric enhancement increases as the decrease of the layer periodicity. However, the dielectric constant of the Pb(Zr,Ti)O3 rhombohedral/tetragonal multilayered films decreases when the layer compositions are away from morphotropic phase boundary (MPB), and no remnant polarization enhancement was observed in all the multilayered films. After comparing the dielectric and ferroelectric properties of the multilayers with the corresponding single-phase films, the dielectric enhancement in P45/P55 multilayers was ascribed to the formation of the MPB region around the interfaces between the P45 and P55 layers.