کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1653493 1007664 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A new approach for estimation of defects detection with infrared thermography
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
A new approach for estimation of defects detection with infrared thermography
چکیده انگلیسی

A new approach is proposed for a priori ascertaining the suitability of infrared thermography for the non-destructive evaluation purposes of materials. The novelty regards a cause/effect relationship between the thermal signature perceived by the infrared camera and a dimensionless group, which includes geometrical and thermal characteristics of the defect and host material. Such relationship, which was experimentally assessed through the evaluation of several specimens, is helpful to predict the thermal contrast associated with a type of defect embedded inside a certain material. This prediction of course is useful in decision making about the use of infrared thermography without preliminary feasibility tests and thus with economic benefits.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 61, Issue 3, February 2007, Pages 747–750
نویسندگان
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