کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
172982 | 458570 | 2011 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A novel optimization method to automated wet-etch station scheduling in semiconductor manufacturing systems
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
مهندسی شیمی (عمومی)
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چکیده انگلیسی
This work addresses the short-term scheduling of one of the most critical stages in the semiconductor industry, the automated wet-etch station (AWS). An efficient MILP-based computer-aided tool is developed in order to achieve a proper synchronization between the activities of sequential chemical and water baths and limited automated wafer's lot transfer devices. The major goal is to find the optimal integrated schedule that maximizes the whole process productivity without generating wafer contamination. Several examples are successfully solved to illustrate the capabilities of the proposed method.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Computers & Chemical Engineering - Volume 35, Issue 12, 14 December 2011, Pages 2960–2972
Journal: Computers & Chemical Engineering - Volume 35, Issue 12, 14 December 2011, Pages 2960–2972
نویسندگان
Adrián M. Aguirre, Carlos A. Méndez, Pedro M. Castro,