کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1789503 | 1524381 | 2016 | 4 صفحه PDF | دانلود رایگان |

• The light output power of the amber LED was enhanced 2.5-fold at 20 mA.
• The Al0.03Ga0.97N barrier led to improved crystalline quality of the InGaN 3QWs.
• The PL-FWHMs were significantly improved with AlN/Al0.03Ga0.97N barriers.
• The strain compensating AlN/AlGaN barrier is very promising for improving the EQE.
We investigated the effect of a combined AlN/Al0.03Ga0.97N barrier on InGaN-based amber light-emitting diodes (LEDs) grown by metalorganic vapor-phase epitaxy. InGaN-based multiple quantum wells with a combined AlN/Al0.03Ga0.97N barrier showed intense photoluminescence with a narrow full-width at half-maximum. The amber LEDs with a combined AlN/Al0.03Ga0.97N barrier achieved a light output power enhanced approximately 2.5-fold at 20 mA compared to that of the LED with a combined AlN/GaN barrier, owing to the reduction of defects in InGaN active layers. Thus, the efficiency of high-In-content InGaN-based LEDs can be improved in the spectrum range of amber.
Journal: Journal of Crystal Growth - Volume 448, 15 August 2016, Pages 105–108